IP Library Assignment 021028/0858
Patent Assignment
Reel/Frame 021028/0858

Assignment of Assignor's Interest

Recorded: 2008-06-02 Pages: 4
Assignors
NARUKAWA, SHOGO
Executed: 2008-05-20
NAGAMURA, YOSHIKAZU
Executed: 2008-05-22
Assignees
DAI NIPPON PRINTING CO., LTD.
1-1, ICHIGAYA-KAGACHO 1-CHOME, SHINJUKU-KU, TOKYO, 162-8001, JAPAN
RENESAS TECHNOLOGY CORP
6-2, OTEMACHI 2-CHOME, CHIYODA-KU, TOKYO, 100-0004, JAPAN
Covered Property (1)
Method of Determining Defects in Photomask
Patent: 7,926,010 →
Application: 12/131,582 →
Publication: US 2008/0301622
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger and Change of Name Sep 9, 2014
From: RENESAS TECHNOLOGY CORP.; NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 033698/0648 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →