IP Library Assignment 021044/0663
Patent Assignment
Reel/Frame 021044/0663

Assignment of Assignor's Interest

Recorded: 2008-06-03 Pages: 3
Assignors
NAKAGAWA, YOSHITOMO
Executed: 2008-03-24
NISHINAKA, KENICHI
Executed: 2008-03-26
Assignee
SII NANO TECHNOLOGY, INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Focused Ion Beam Apparatus
Patent: 7,755,065 →
Application: 12/046,987 →
Publication: US 2008/0308741
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →