IP Library Assignment 021056/0570
Patent Assignment
Reel/Frame 021056/0570

Assignment of Assignor's Interest

Recorded: 2008-05-22 Pages: 5
Assignors
SHIMSHI, RINAT
Executed: 2008-05-07
NEHMADI, YOUVAL
Executed: 2008-05-10
SVIDENKO, VICKY
Executed: 2008-05-08
SCHWARM, ALEXANDER T.
Executed: 2008-05-18
JAWAHARLAL, SUNDAR
Executed: 2008-05-20
Assignee
APPLIED MATERIALS, INC.
3050 BOWERS AVE, SANTA CLARA, CALIFORNIA, 95054
Covered Property (1)
Dynamic Inline Yield Analysis and Prediction of a Defect Limited Yield Using Inline Inspection Defects
Patent: 7,937,179 →
Application: 12/154,459 →
Publication: US 2008/0294281