Patent Assignment
Reel/Frame 021061/0010
Assignment of Assignor's Interest
Recorded: 2008-06-06
Pages: 2
Assignor
KIM, BO-YEUN
Executed: 2008-05-29
Assignee
HYNIX SEMICONDUCTOR, INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI, KYOUNGKI-DO, 467-860, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Memory Device and Parallel Test Method of the Same