Assignment of Assignor's Interest

Recorded: 2008-05-30 Pages: 3

Assignor

NAGATA, SHUNYA

Executed: 2008-05-19

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Semiconductor memory device and test method therefor

Application: 12/155,240 →

Publication: US 2008/0298148

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.