IP Library › Assignment 021073/0764
Patent Assignment
Reel/Frame 021073/0764

Assignment of Assignor's Interest

Recorded: 2008-06-10 Pages: 3
Assignors
ANDO, TOHRU
Executed: 2007-08-09
NARA, YASUHIKO
Executed: 2007-08-09
SAITO, TSUTOMU
Executed: 2007-08-09
KATO, SHINICHI
Executed: 2007-08-09
SUNAOSHI, TAKESHI
Executed: 2007-08-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Testing Method and Semiconductor Tester
Patent: 7,732,791 →
Application: 11/834,207 →
Publication: US 2008/0237462
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →