IP Library Assignment 021121/0930
Patent Assignment
Reel/Frame 021121/0930

Assignment of Assignor's Interest

Recorded: 2008-06-19 Pages: 8
Assignor
INVARIUM, INC.
Executed: 2008-06-04
Assignee
CADENCE DESIGN SYSTEMS, INC.
2655 SEELY AVENUE, SAN JOSE, CALIFORNIA, 95134-1931
Covered Property (1)
Method and System for Reducing the Impact of Across-Wafer Variations on Critical Dimension Measurements
Patent: 7,588,868 →
Application: 10/971,350 →
Publication: US 2006/0073686
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 8, 2005
From: ZACH, FRANZ X.; SEZGINER, ABDURRAHMAN; PERCIN, GOKHAN
To: INVARIUM, INC.
Reel/Frame 015858/0885 →