Assignment of Assignor's Interest

Recorded: 2008-06-23 Pages: 3

Assignors

YAMADA, DAISUKE

Executed: 2008-06-12

KIMURA, KIYOSHI

Executed: 2008-06-12

HARA, FUJIO

Executed: 2008-06-12

Assignee

JSR CORPORATION

6-10, TSUKIJI 5-CHOME, CHUO-KU, TOKYO, 104-0045, JAPAN

Covered Property (1)

Circuit Board Apparatus for Wafer Inspection, Probe Card, and Wafer Inspection Apparatus

Patent: 7,821,283 →

Application: 12/158,499 →

Publication: US 2009/0039906

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.