Patent Assignment
Reel/Frame 021173/0442
Assignment of Assignor's Interest
Recorded: 2008-06-30
Pages: 2
Assignors
TANIOKA, MICHINOBU
Executed: 2008-03-04
HOSHINO, SHIGEKI
Executed: 2008-03-04
TAURA, TORU
Executed: 2008-03-04
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, 108-8001, JAPAN
Covered Property
(1)
Semiconductor Device Testing Apparatus and Power Supply Unit for Semiconductor Device Testing Apparatus