IP Library Assignment 021200/0162
Patent Assignment
Reel/Frame 021200/0162

Assignment of Assignor's Interest

Recorded: 2008-07-07 Pages: 2
Assignor
HARADA, EIJI
Executed: 2008-06-12
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Test Apparatus, Pattern Generator, Test Method and Pattern Generating Method
Patent: 7,934,136 →
Application: 12/142,491 →
Publication: US 2008/0319700
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 28, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025214/0696 →