Patent Assignment
Reel/Frame 021223/0396
Assignment of Assignor's Interest
Recorded: 2008-06-26
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Charged Particle Beam Apparatus and Specimen Inspection Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.