Patent Assignment
Reel/Frame 021309/0241
Assignment of Assignor's Interest
Recorded: 2008-07-29
Pages: 3
Assignor
KAITO, TAKASHI
Executed: 2007-11-15
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method of Manufacturing Sample for Atom Probe Analysis by Fib and Focused Ion Beam Apparatus Implementing the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.