Patent Assignment
Reel/Frame 021365/0868
Assignment of Assignor's Interest
Recorded: 2008-08-01
Pages: 3
Assignor
SHIMAMOTO, YUKIHIRO
Executed: 2008-07-25
Assignee
SHARP KABUSHIKI KAISHA
22-22 NAGAIKE-CHO, ABENO-KU, OSAKA-SHI, OSAKA, 545-8522, JAPAN
Covered Property
(1)
Ring Oscillation Circuit, Delay Time Measuring Circuit, Testing Circuit, Clock Generating Circuit, Image Sensor, Pulse Generating Circuit, Semiconductor Integrated Circuit, and Testing Method Thereof