IP Library › Assignment 021404/0086
Patent Assignment
Reel/Frame 021404/0086

Assignment of Assignor's Interest

Recorded: 2008-08-18 Pages: 2
Assignors
URANO, YUTA
Executed: 2008-05-28
SAKAI, KAORU
Executed: 2008-05-28
MAEDA, SHUNJI
Executed: 2008-05-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPOARATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection System and Method of the Same
Patent: 8,274,652 →
Application: 12/109,363 →
Publication: US 2008/0297783
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →