Patent Assignment
Reel/Frame 021413/0182
Assignment of Assignor's Interest
Recorded: 2008-08-14
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Device and Defect Inspection Method for Inspecting Whether a Product Has Defects