IP Library › Assignment 021621/0228
Patent Assignment
Reel/Frame 021621/0228

Assignment of Assignor's Interest

Recorded: 2008-09-26 Pages: 2
Assignors
CHENG, ZHAOHUI
Executed: 2008-07-19
YANO, TASUKU
Executed: 2008-07-24
OMORI, SEIKO
Executed: 2008-09-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14 NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Localized Static Charge Distribution Precision Measurement Method and Device
Patent: 7,928,384 →
Application: 12/222,577 →
Publication: US 2009/0057557
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →