Patent Assignment
Reel/Frame 021628/0203
Assignment of Assignor's Interest
Recorded: 2008-10-03
Pages: 2
Assignor
OZEKI, SEIJI
Executed: 2008-09-26
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Storage Device and Memory Cell Test Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.