Patent Assignment
Reel/Frame 025214/0687
Change of Name
Recorded: 2010-10-28
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Production Method, Design Method and Design System for Semiconductor Integrated Circuit
System and method for automatic layout of integrated circuit
Application:
12/216,905 →
Publication:
US 2009/0019413
Semiconductor device
Application:
12/216,955 →
Publication:
US 2009/0021075
Processor and data load method using the same including a data load technique reading out unaligned data block from a data memory to a register file included in the processor
Application:
12/216,956 →
Publication:
US 2009/0037702
Horizontal Synchronization Detection Device
Microprocessor Performing Iir Filter Operation with Registers
Memory Controller, Bus System, Integrated Circuit, and Control Method of Integrated Circuit Including Controlling Flow of Data to and from Memory
Layout correcting method for semiconductor integrated circuit and layout correcting device for semiconductor integrated circuit
Application:
12/219,021 →
Publication:
US 2009/0031267
Semiconductor Apparatus and Method of Manufacturing the Same
Method and System for Designing Semiconductor Integrated Circuit Providing Dummy Pattern in Divided Layout Region
Method and Program for Designing Semiconductor Integrated Circuit Using Peripheral Parameter
Method of Designing Semiconductor Integrated Circuit and Mask Data Generation Program
Method and Program for Designing Semiconductor Integrated Circuit
Class D Amplifier
Level Shifter
Amplifying circuit and display unit
Application:
12/219,431 →
Publication:
US 2009/0040165
On-Vehicle Image Processing Apparatus
Controller for Induction Motor
Memory Read Control Circuit
Synchronous Circuit and Method for Receiving Data
Ion Implanting Apparatus for Forming Ion Beam Shape
Semiconductor Device Having Seal Ring Structure
Semiconductor Memory Device Including Sram Cell Having Well Power Potential Supply Region Provided Therein
Integrated Circuit Design Based on Scan Design Technology
Wobble signal demodulation method and wobble signal demodulator
Application:
12/219,743 →
Publication:
US 2009/0040889
Delay Time Adjusting Method of Semiconductor Integrated Circuit
Display device and operating method of the same
Application:
12/219,891 →
Publication:
US 2009/0033645
Television Set
Hierarchical cache memory system
Application:
12/222,279 →
Publication:
US 2009/0055591
Circuit Design Device, Circuit Design Program, and Circuit Design Method
Microprocessor and Method of Processing Data Including Peak Value Candidate Selecting Part and Peak Value Calculating Part
Voltage Controlled Oscillator
Dummy Pattern Placement Apparatus, Method and Program and Semiconductor Device
Semiconductor Apparatus
Apparatus and Method for Dummy Pattern Arrangement
Non-volatile semiconductor memory device having an erasing gate
Application:
12/222,636 →
Publication:
US 2009/0085090
Semiconductor Device Capable of Switching Operation Modes
Semiconductor Apparatus
Non-Volatile Semiconductor Memory Device Having an Erasing Gate
Non-volatile semiconductor memory device having an erasing gate
Application:
12/222,699 →
Publication:
US 2009/0085092
Semiconductor Device Capable of Switching Operation Modes and Operation Mode Setting Method Therefor
Signal Processing Apparatus and Signal Processing Method Performing Gamma Correction
Variable Gain Circuit
SWITCHABLE HIGH PASS FILTER/LOW PASS FILTER PHASE SHIFTER HAVING A SWITCH CIRCUIT WITH FETs CONNECTED IN PARALLEL
Electronic Package Device, Module, and Electronic Apparatus
Multi-Band Frequency Synthesizer Circuit and Method
Application:
12/224,780 →
Publication:
US 2009/0098833
Formation Method of Metallic Compound Layer, Manufacturing Method of Semiconductor Device, and Formation Apparatus for Metallic Compound Layer
Circuit and Method for Improved Offset Adjustment of Differential Amplifier Within Data Receiving Apparatus
Method of Measuring Micro-Structure, Micro-Structure Measurement Apparatus, and Micro-Structure Analytical System
Layout Method and Layout Apparatus for Semiconductor Integrated Circuit
Memory Control Circuit, Semiconductor Integrated Circuit, and Verification Method of Nonvolatile Memory
Semiconductor Apparatus Including Semiconductor Chip with Stress Material Selectively Provided in Region of Wiring Layer
Memory Cell and Semiconductor Memory Device Having Thereof Memory Cell
Data Processing Device and Method of Reading Trimming Data
Semiconductor Device Including Memory Having Nodes Connected with Continuous Diffusion Layer but Isolated from Each Other by Transistor
Reference Voltage Circuit Compensated for Temperature Non-Linearity
Application:
12/230,856 →
Publication:
US 2009/0066313
Semiconductor circuit
Application:
12/230,906 →
Publication:
US 2009/0091354
Semiconductor Integrated Circuit and Method of Controlling the Same
Drive Circuit for Display Apparatus and Display Apparatus
Drive Circuit for Display Apparatus and Display Apparatus
Semiconductor Device, and Manufacturing Method of Semiconductor Device
Method of Adjusting Timing Difference Between Pre-Corrected Source Program and Post-Corrected Source Program, Compiler and Information Processor
Semiconductor device having silicon-on-insulator (SOI) structure and method of forming semiconductor device
Application:
12/232,006 →
Publication:
US 2009/0085150
Optical Disk Device
Application:
12/232,043 →
Publication:
US 2009/0092030
Current Detection Crcuit and Current Detection Method
Latch circuit
Application:
12/232,071 →
Publication:
US 2009/0102532
Microprocessor
Semiconductor Integrated Circuit
Semiconductor Device Having Trench Gate Structure
Semiconductor Circuit
Semiconductor Storage Device
Semiconductor integrated circuit and method for controlling semiconductor integrated circuit
Application:
12/232,162 →
Publication:
US 2009/0085626
Semiconductor Storage Device Including Counter Noise Generator and Method of Controlling the Same
Apparatus and Method for Verifying Target Cicuit
Evaluation Pattern Suitable for Evaluation of Lateral Hillock Formation
Appearance for inspection method
Application:
12/232,487 →
Publication:
US 2009/0080762
Soldering Method for Mounting Semiconductor Device on Wiring Board to Ensure Invariable Gap Therebetween, and Soldering Apparatus Therefor
Semiconductor storage device and manufacturing method of the same
Application:
12/232,643 →
Publication:
US 2009/0085124
Semiconductor Device and Method of Manufacturing the Same
Field-Effect Transistor, Semiconductor Chip and Semiconductor Device
Method of Fabricating Semiconductor Device
Semiconductor Device
Semiconductor Device Including Wiring Excellent in Impedance Matching, and Method for Designing the Same
Filter Operation Unit and Motion-Compensating Device
Semiconductor Device with Discontinuous Silicide Layers
Application:
12/237,433 →
Publication:
US 2009/0085131
Semiconductor Storage Device
Lead Forming Apparatus and Method of Fabricating Semiconductor Device
Semiconductor Storage Device and Memory Cell Test Method
Semiconductor Integrated Circuit and Method of Testing Same
Application:
12/245,395 →
Publication:
US 2009/0094494
Optical Semiconductor Device and Method of Manufacturing Same
Semiconductor Device
Compact via Transmission Line for Printed Circuit Board and Design Method of the Same
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 10, 2008
From: SAITO, TOSHIYUKI; YOSHINO, TETSUO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021285/0756 →
Assignment of Assignor's Interest
Jul 11, 2008
From: KOBAYASHI, NAOHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021285/0447 →
Assignment of Assignor's Interest
Jul 14, 2008
From: MATSUYAMA, HIDEKI; DAITOU, MASAYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021274/0856 →
Assignment of Assignor's Interest
Jul 14, 2008
From: OHNO, KATSUMARU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021285/0416 →
Assignment of Assignor's Interest
Jul 14, 2008
From: MORITA, HIROSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021273/0881 →
Assignment of Assignor's Interest
Jul 14, 2008
From: MATSUI, TAKEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021471/0357 →
Assignment of Assignor's Interest
Jul 15, 2008
From: ITAGAKI, DAISHIN
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021287/0299 →
Assignment of Assignor's Interest
Jul 15, 2008
From: UEKI, TAKESHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021277/0720 →
Assignment of Assignor's Interest
Jul 15, 2008
From: YAMADA, KENTA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021279/0598 →
Assignment of Assignor's Interest
Jul 15, 2008
From: YAMADA, KENTA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021279/0601 →
Assignment of Assignor's Interest
Jul 15, 2008
From: HARA, TOSHIYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021280/0034 →
Assignment of Assignor's Interest
Jul 21, 2008
From: KOMATSU, TERUMITSU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021334/0729 →
Assignment of Assignor's Interest
Jul 22, 2008
From: SHIMATANI, ATSUSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021326/0461 →
Assignment of Assignor's Interest
Jul 22, 2008
From: AMAGASAKI, JUNKO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021326/0784 →
Assignment of Assignor's Interest
Jul 22, 2008
From: KUGE, HIROYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021326/0799 →
Assignment of Assignor's Interest
Jul 23, 2008
From: NAKASHIMA, HIDEMI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021331/0904 →
Assignment of Assignor's Interest
Jul 23, 2008
From: KAMIKISAKI, SUMIYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021332/0794 →
Assignment of Assignor's Interest
Jul 23, 2008
From: YAMADA, KENTA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021279/0595 →
Assignment of Assignor's Interest
Jul 29, 2008
From: MATSUI, TAKEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021310/0683 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →