Method of measuring micro-structure, micro-structure measurement apparatus, and micro-structure analytical system
View Patent ↗This invention provides a method and an apparatus of measuring a micro-structure, capable of evaluating a geometry of a micro-structure formed typically on the surface of a semiconductor substrate, in a non-destructive, easy, precise and quantitative manner. A reflection spectrum of a sample having a known dimension of a target micro-geometry is measured (A 1 ), features (waveform parameters) which strongly correlate to a dimension of the measured micro-geometry are determined (A 2 ), a relation between the dimension of the micro-geometry and the waveform parameters is found (A 3 ), and a dimension of the micro-structure having an unknown dimension is finally determined using this relation and based on the reflection spectrum obtained therefrom (A 4 , A 5 ).
1. A method of measuring, comprising:
measuring a measured value of a reflection spectrum of a sample having a known dimension;
obtaining a calculated value of the reflection spectrum based on the dimension of said sample and a set initial value of a ratio of a scattered light;
calculating a sum of squares of deviation between said measured value and said calculated value, varying said initial value of said ratio of said scattered light until the sum of squares of deviation falls within predetermined allowable range to obtain a fixed value of the ratio of said scattered light; and
measuring a dimension of a sample having an unknown dimension from the reflection spectrum of the sample having the unknown dimension according to said fixed value.
2. The method of measuring according to claim 1 ,
wherein both of said sample having the known dimension and said sample having the unknown dimension include a periodic structure.
3. The method of measuring according to claim 2 ,
wherein said dimension includes a height, a duty, and a periodicity of a periodic structure.
4. A method of measuring, comprising:
irradiating a first sample including a periodic structure with a measuring beam to measure a reflection spectrum;
measuring the dimension of said first sample with microscope observation;
setting a first initial value of the ratio of the scattered light;
calculating the reflection spectrum based on said first initial value and the measured dimension of said sample;
calculating a sum of squares of deviation between the calculated value of said reflection spectrum and the measured value of said reflection spectrum;
judging whether said sum of squares of deviation falls within a predetermined allowable range;
varying a set values of a ratio of said scattered light, when said sum of squares of deviation is judged as falling outside said predetermined allowable range;
adapting a ratio of scattered light set in order to obtain the calculated value of the reflection spectrum as the fixed value for the sample to be measured, when said sum of squares of deviation is judged as falling within said predetermined allowable range; and
obtaining a dimension of a second sample including a periodic structure having an unknown dimension sample from the measured value of the reflection spectrum of said second sample according to said fixed value.
5. The method of measuring according to claim 4 , wherein said obtaining the dimension of said second sample comprises:
measuring a reflection spectrum of said second sample;
setting a second initial value of the dimension of the second sample;
calculating the reflection spectrum based on said second initial value and said fixed value;
calculating a sum of squares of deviation between the calculated value of the reflection spectrum and the measured value of the reflection spectrum;
judging whether said sum of squares of deviation falls within the predetermined allowable range;
varying an initial value of a dimension in a geometry of said second sample, when said sum of squares of deviation is judged as falling outside said predetermined allowable range; and
outputting the dimension of said second sample used for calculating said reflection spectrum, when said sum of squares of deviation is judged step as falling within said predetermined allowable range.
6. The method of measuring according to claim 5 , wherein said dimension includes a height, a duty and a periodicity of the periodic structure.