Assignment of Assignor's Interest

Recorded: 2008-10-03 Pages: 2

Assignor

TAKESHIMA, TOSHIO

Executed: 2008-09-09

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Semiconductor Integrated Circuit and Method of Testing Same

Application: 12/245,395 →

Publication: US 2009/0094494

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.