Assignment of Assignor's Interest

Recorded: 2008-10-07 Pages: 2

Assignor

TAKIZAWA, SHIGEKI

Executed: 2008-09-02

Assignee

ADVANTEST CORPORATION

1-32-1, ASAHI-CHO, NERIMA-KU, TOKYO, 1790071, JAPAN

Covered Property (1)

Interconnection Substrate, Skew Measurement Method, and Test Apparatus

Patent: 7,768,255 →

Application: 12/199,811 →

Publication: US 2010/0052723

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.