Patent Assignment
Reel/Frame 021687/0851
Assignment of Assignor's Interest
Recorded: 2008-10-15
Pages: 2
Assignors
WANG, BILY
Executed: 2008-09-26
CHEN, KUEI-PAO
Executed: 2008-09-26
CHEN, HSIN-CHENG
Executed: 2008-09-26
CHOU, MING-HAO
Executed: 2008-09-26
Assignee
YOUNGTEK ELECTRONICS CORPORATION
4F, NO. 5 TECHNOLOGY RD., SCIENCE-BASED INDUSTRIAL PARK, HSINCHU 300, R.O.C., TAIWAN
Covered Property
(1)
Testing System and Testing Method for Inspecting Electonic Devices