IP Library Assignment 021698/0468
Patent Assignment
Reel/Frame 021698/0468

Assignment of Assignor's Interest

Recorded: 2008-10-17 Pages: 2
Assignors
SATO, HIDETOSHI
Executed: 2008-09-05
MATSUOKA, RYOICHI
Executed: 2008-09-05
SUTANI, TAKUMICHI
Executed: 2008-09-05
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14 NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Measurement Method and Pattern Measurement System
Patent: 7,800,060 →
Application: 12/182,810 →
Publication: US 2009/0032707
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →