Patent Assignment
Reel/Frame 021746/0252
Assignment of Assignor's Interest
Recorded: 2008-10-21
Pages: 3
Assignors
TAKEHARA, HISATO
Executed: 2008-10-01
WAKAMIYA, YUJI
Executed: 2008-10-06
NISHIDA, TOMOYUKI
Executed: 2008-10-03
Assignee
SYSMEX CORPORATION
1-5-1 WAKINOHAMA-KAIGANDORI, KOBE, HYOGO, 651-0073, JAPAN
Covered Property
(1)
Specimen analyzer, abnormality control method of the same and computer program product