Patent Assignment
Reel/Frame 021889/0705
Assignment of Assignor's Interest
Recorded: 2008-11-25
Pages: 3
Assignors
BANZHOF, HELMUT
Executed: 2008-11-20
FROSIEN, JUERGEN
Executed: 2008-11-20
WINKLER, DIETER
Executed: 2008-11-20
Assignee
ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH
AMMERTHALSTRASSE 20A, HEIMSTETTEN, 85551, GERMANY
Covered Property
(1)
High Resolution Gas Field Ion Column with Reduced Sample Load