IP Library Assignment 021898/0561
Patent Assignment
Reel/Frame 021898/0561

Assignment of Assignor's Interest

Recorded: 2008-11-18 Pages: 2
Assignors
MOROKUMA, HIDETOSHI
Executed: 2008-08-06
SUGIYAMA, AKIYUKI
Executed: 2008-07-29
MATSUOKA, RYOICHI
Executed: 2008-07-29
SUTANI, TAKUMICHI
Executed: 2008-07-30
TOYODA, YASUTAKA
Executed: 2008-08-21
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Sample Dimension Inspecting/Measuring Method and Sample Dimension Inspecting/Measuring Apparatus
Patent: 7,923,703 →
Application: 12/279,564 →
Publication: US 2009/0218491
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →