IP Library › Assignment 022002/0714
Patent Assignment
Reel/Frame 022002/0714

Assignment of Assignor's Interest

Recorded: 2008-12-18 Pages: 2
Assignors
HIRAI, TAKEHIRO
Executed: 2008-03-31
OBARA, KENJI
Executed: 2008-03-31
YAMAGUCHI, KOHEI
Executed: 2008-03-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Review Apparatus and Method of Reviewing Defects
Patent: 7,869,969 →
Application: 12/108,068 →
Publication: US 2008/0270044
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →