Patent Assignment
Reel/Frame 022023/0370
Assignment of Assignor's Interest
Recorded: 2008-12-23
Pages: 3
Assignee
HERMES MICROVISION, INC.
5F, NO. 18, CREATION ROAD 1, HSINCHU SCIENCE PARK, HSINCHU, TAIWAN
Covered Property
(1)
Method and System for Determining a Defect During Sample Inspection Involving Charged Particle Beam Imaging
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.