Assignment of Assignor's Interest

Recorded: 2008-12-24 Pages: 3

Assignors

FANG, WEI

Executed: 2008-12-17

ZHANG, ZHAO-LI

Executed: 2008-12-17

JAU, JACK

Executed: 2008-12-17

Assignee

HERMES MICROVISION, INC.

5F, NO. 18, CREATION ROAD 1, HSINCHU SCIENCE PARK, HSINCHU, TAIWAN

Covered Property (1)

Method and System of Classifying Defects on a Wafer

Application: 12/343,201 →

Publication: US 2010/0158346

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.