Patent Assignment
Reel/Frame 022058/0882
Assignment of Assignor's Interest
Recorded: 2008-12-29
Pages: 2
Assignors
UTO, SACHIO
Executed: 2008-09-16
NISHIYAMA, HIDETOSHI
Executed: 2008-10-06
NOGUCHI, MINORI
Executed: 2008-10-03
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Apparatus and Method for Inspecting Defect on Object Surface