IP Library › Assignment 022081/0857
Patent Assignment
Reel/Frame 022081/0857

Assignment of Assignor's Interest

Recorded: 2009-01-09 Pages: 3
Assignor
SCIENCE AND TECHNOLOGY CORPORATION
Executed: 2008-12-22
Assignee
Covered Property (1)
Method of Generating X-Ray Diffraction Data for Integral Detection of Twin Defects in Super-Hetero-Epitaxial Materials
Patent: 7,558,371 →
Application: 12/254,150 →
Publication: US 2009/0103680
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 14, 2008
From: CHOI, SANG HYOUK; KING, GLEN C.; ELLIOTT, JAMES R.
To: UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
Reel/Frame 021836/0293 →