IP Library Assignment 022195/0833
Patent Assignment
Reel/Frame 022195/0833

Assignment of Assignor's Interest

Recorded: 2009-01-22 Pages: 3
Assignor
MIZOGUCHI, OSAMU
Executed: 2009-01-16
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Method for Manufacturing Semiconductor Device Including Testing Dedicated Pad and Probe Card Testing
Patent: 7,713,764 →
Application: 12/320,263 →
Publication: US 2010/0009473
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 28, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025214/0678 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →