Patent Assignment
Reel/Frame 025214/0678
Change of Name
Recorded: 2010-10-28
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Semiconductor Device, Method of Manufacturing the Same, and Signal Transmitting/Receiving Method Using the Semiconductor Device
Self-Diagnostic Circuit and Self-Diagnostic Method for Detecting Errors
Amplification Circuit
Electronic Component, Semiconductor Package, and Electronic Device
Application:
12/298,285 →
Publication:
US 2009/0174052
Semiconductor Device, Integrated Circuit, and Semiconductor Manufacturing Method
Application:
12/302,121 →
Publication:
US 2009/0321849
Semiconductor Device
Application:
12/303,822 →
Publication:
US 2010/0224941
Wiring Board, Semiconductor Device Using Wiring Board and Their Manufacturing Methods
Semiconductor device manufacturing method and semiconductor device
Application:
12/311,428 →
Publication:
US 2010/0084713
Semiconductor Integrated Device and Manufacturing Method for the Same
Semiconductor Storage Device and Resetting Method for a Semiconductor Storage Device
Information Processing Apparatus and Method of Updating Stack Pointer
DC-DC converter drive circuit which has step up mode and step down mode
Application:
12/314,140 →
Publication:
US 2009/0153115
Test board used for a reliability test and reliability test method
Application:
12/314,141 →
Publication:
US 2009/0189632
Data Processing Apparatus and Address Space Protection Method
Semiconductor device having gate electrode including contact portion on element isolation region
Application:
12/314,230 →
Publication:
US 2009/0159977
Apparatus and method for analyzing circuit
Application:
12/314,231 →
Publication:
US 2009/0150138
Apparatus and Method for Driving Liquid Crystal Display Panel with Data Driver Including Gamma Correction Circuitry and Drive Circuitry
Load Driving Device
Semiconductor Output Circuit for Controlling Power Supply to a Load
Semiconductor Output Circuit
Read circuit, variable resistive element device, and imaging device
Application:
12/314,434 →
Publication:
US 2009/0167406
Wiring substrate
Application:
12/314,435 →
Publication:
US 2009/0159315
Read Circuit, Variable Resistive Element Device, and Imaging Device
Operational Amplifier and Integrating Circuit
Step-Down Circuit, Semiconductor Device, and Step-Down Circuit Controlling Method
Data Line Driving Circuit, Driver I C and Display Apparatus
Load Driving Device
Data Processing Device and Bus Access Control Method Therein
Termination Circuit
Measuring Method Including Measuring Angle of Concave Portion and Irradiating Light Over Concave Portion
Signal Line Driving Device Comprising a Plurality of Outputs
Apparatus and method for driving liquid crystal display panel
Application:
12/314,588 →
Publication:
US 2009/0153533
Operational Amplifier, Drive Circuit, and Method for Driving Liquid Crystal Display Device
Power Supply Circuit Having Resistance Element Changing Its Resistance Value to Limit Current Flowing to Capacitive Load
Power Switch Circuit Having Variable Resistor Coupled Between Input Terminal and Output Transistor and Changing Its Resistance Based on State of Output Transistor
Semiconductor Integrated Circuit Device Which Has First Chip and Second Chip Accessed via the First Chip and Test Method Thereof
Layout design device and layout design method of semiconductor integrated circuit
Application:
12/314,824 →
Publication:
US 2009/0164959
System and Method for Circuit Simulation
Radio Receiver, Audio System, and Method of Manufacturing Radio Receiver
Direct sequence spread spectrum device and method for communication therewith
Application:
12/314,908 →
Publication:
US 2009/0161735
Level Shift Circuit, and Driver and Display System Using the Same
Delay Control Circuit and Delay Control Method
Nonvolatile Semiconductor Memory with Erase Gate and Its Manufacturing Method
Differential Amplifier with Symmetric Circuit Topology
Voltage converting circuit
Application:
12/314,980 →
Publication:
US 2009/0167419
High Frequency Switch Circuit Having Reduced Input Power Distortion
Output port, microcomputer and data output method
Application:
12/318,105 →
Publication:
US 2009/0168550
Microcomputer and Its Instruction Execution Method Including Branch Instruction Inclusive of a Plurality of Target Address Instructions to Minimize Branch Penalty Delays
Application:
12/318,210 →
Publication:
US 2010/0082946
Memory Control Circuit and Intergrated Circuit Including Branch Instruction Detection and Operation Mode Control of a Memory
Test Circuit
Data processing system and debug method
Application:
12/318,299 →
Publication:
US 2010/0064174
Adaptive Equalizer and Adaptive Equalization Method
System and method for distributing design system, design system distributing server, and client system
Application:
12/318,686 →
Publication:
US 2010/0057839
Reference Voltage Generation Circuit and Start-Up Control Method Therefor
Processor apparatus and conditional branch processing method
Application:
12/318,726 →
Publication:
US 2009/0177874
Semiconductor Device
Reticle, and Method of Laying Out Wirings and Vias
Local signal generation circuit
Application:
12/318,953 →
Publication:
US 2009/0201065
Semiconductor package, and method of manufacturing semiconductor package
Application:
12/320,050 →
Publication:
US 2009/0201656
Displaying Apparatus, Displaying Panel Driver and Displaying Panel Driving Method
Semiconductor Device, Semiconductor Wafer, and Methods of Producing the Same Device and Wafer
Semiconductor Device, Method of Manufacturing Thereof, Signal Transmission/Reception Method Using Such Semiconductor Device, and Tester Apparatus
Method of Manufacturing Semiconductor Device, and Semiconductor Device
Non-Volatile Semiconductor Memory Device
Semiconductor Device with Stress Control Film Utilizing Film Thickness
Semiconductor Integrated Circuit Device Having Standard Cell Including Resistance Element
Adapter Board and Method for Manufacturing Same, Probe Card, Method for Inspecting Semiconductor Wafer, and Method for Manufacturing Semiconductor Device
Plasma processing apparatus
Application:
12/320,262 →
Publication:
US 2009/0194023
Method for Manufacturing Semiconductor Device Including Testing Dedicated Pad and Probe Card Testing
Signal Processing Method and Circuit to Convert Analog Signal to Digital Signal
Layout Design Method of Semiconductor Integrated Circuit
Frequency Synthesizer
Method and apparatus for manufacturing semiconductor device
Application:
12/320,399 →
Publication:
US 2009/0197370
Semiconductor Device and Verify Method for Semiconductor Device
Semiconductor Apparatus and Anomaly Detection Method of the Same
Method of Designing Semiconductor Integrated Circuit Having Function to Adjust Delay Pass and Apparatus for Supporting Design Thereof
Data transmission system for exchanging multi-channel signals
Application:
12/320,644 →
Publication:
US 2009/0195272
Level Shift Circuit, and Driver and Display System Using the Same
Data line driving circuit outputting gradation signals in different timing, display device, and data line driving method
Application:
12/320,783 →
Publication:
US 2009/0207192
Wiring Placement Method of Wirings Having Different Length and Semiconductor Integrated Circuit Device
Counter Circuit
Semiconductor device
Digital-To-Analog Converting Circuit, Data Driver and Display Device
Novolatile Semiconductor Memory Device with Floating Gate and Erase Erase Gate and Method of Manufacturing the Same
Application:
12/320,889 →
Publication:
US 2009/0200600
Nonvolatile semiconductor memory device and method of manufacturing the same
Application:
12/320,890 →
Publication:
US 2009/0200594
Nonvolatile Semiconductor Memory Device and Method of Manufacturing the Same
Operational Amplifier Circuit and Display Apparatus Using the Same
Split-Gate Nonvolatile Semiconductor Memory Device
Liquid Crystal Display and Driving Method Thereof
Dc Converter Which Has Switching Control Unit to Select Pwm Signal or Pfm Signal
Communication terminal, network server, and communication network system
Application:
12/320,982 →
Publication:
US 2009/0221296
System, Program and Method for Calculating Equipment Load Factor
Application:
12/320,983 →
Publication:
US 2009/0234482
Related Assignments
(23)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 23, 2008
From: SOGAWA, YOSHIMICHI; YAMAZAKI, TAKAO; TAKAHASHI, NOBUAKI
To: NEC CORPORATION; NEC ELECTRONICS CORPORATION
Reel/Frame 021728/0640 →
Assignment of Assignor's Interest
Nov 20, 2008
From: MAEDA, TADASHI; YAMASE, TOMOYUKI
To: NEC CORPORATION
Reel/Frame 021864/0205 →
Assignment of Assignor's Interest
Nov 26, 2008
From: NAKASHIBA, YASUTAKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021945/0800 →
Assignment of Assignor's Interest
Dec 2, 2008
From: OKAMOTO, HITOSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021969/0198 →
Assignment of Assignor's Interest
Dec 3, 2008
From: ONO, RIKA; SUZUKI, HITOSHI; SATO, JUNICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021970/0006 →
Assignment of Assignor's Interest
Dec 3, 2008
From: TAKANO, SUSUMU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021969/0776 →
Assignment of Assignor's Interest
Dec 4, 2008
From: KAWANO, SHOUTA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021969/0534 →
Assignment of Assignor's Interest
Dec 4, 2008
From: HENMI, KAZUO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 021969/0540 →
Assignment of Assignor's Interest
Dec 5, 2008
From: ITOU, KAZUYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022005/0811 →
Assignment of Assignor's Interest
Dec 5, 2008
From: KOBAYASHI, SUSUMU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022005/0786 →
Assignment of Assignor's Interest
Dec 5, 2008
From: ONO, RIKA; SUZUKI, HITOSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022005/0807 →
Assignment of Assignor's Interest
Dec 8, 2008
From: UMEDA, KENGO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022019/0457 →
Assignment of Assignor's Interest
Dec 9, 2008
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022005/0983 →
Assignment of Assignor's Interest
Dec 10, 2008
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022026/0233 →
Assignment of Assignor's Interest
Dec 10, 2008
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022028/0455 →
Assignment of Assignor's Interest
Jan 16, 2009
From: MIYAMURA, MAKOTO; TAKEUCHI, KIYOSHI
To: NEC CORPORATION
Reel/Frame 022120/0113 →
Assignment of Assignor's Interest
Jan 27, 2009
From: KIKUCHI, KATSUMI; YAMAMICHI, SHINTARO; MURAI, HIDEYA; FUNAYA, TAKUO
To: NEC CORPORATION; NEC ELECTRONICS CORPORATION
Reel/Frame 022158/0470 →
Assignment of Assignor's Interest
Jan 29, 2009
From: UEJIMA, KAZUYA; NAKAMURA, HIDETATSU; SAKAKIDANI, AKIHITO; WATANABE, EIICHIROU
To: NEC CORPORATION; NEC ELECTRONICS CORPORATION
Reel/Frame 022170/0531 →
Assignment of Assignor's Interest
Jan 30, 2009
From: MOCHIZUKI, HIDEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022212/0452 →
Assignment of Assignor's Interest
Aug 19, 2009
From: NAKAGAWA, TAKASHI; TATSUMI, TORU; MANABE, KENZO; TAKAHASHI, KENSUKE
To: NEC CORPORATION
Reel/Frame 023132/0817 →
Assignment of Assignor's Interest
Jun 11, 2010
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024524/0463 →
Assignment of Assignor's Interest
Jul 12, 2013
From: NEC CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 030783/0873 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →