Semiconductor device and verify method for semiconductor device
View Patent ↗A semiconductor device includes a memory module provided with a plurality of memory cells, a verify determination unit that performs quality determination of read data that have been read from the memory cells on the basis of the read data and an expected value prepared in advance, and a power source monitoring circuit that detects fluctuations equal to or greater than a predetermined variation rate in a power source voltage supplied to the memory module and outputs a power source abnormality detection signal. Furthermore, the verify determination unit invalidates a result of the quality determination when the power source abnormality detection signal indicates an abnormal state of the power source voltage.
1. A semiconductor device comprising:
a memory module including a reference current generation circuit that generates a reference current on the basis of a power source voltage and a comparator that compares a cell current read from one of a plurality of memory cells with the reference current and generates read data;
a verify determination unit that performs quality determination of the accuracy of read data that have been read from the memory cells on the basis of the read data and an expected value prepared in advance; and
a power source monitoring circuit that detects fluctuations equal to or greater than a predetermined variation rate in a power source voltage supplied to the memory module and outputs a power source abnormality detection signal,
wherein the power source monitoring circuit detects fluctuations equal to or greater than a predetermined variation rate in the power source voltage and fluctuations equal to or greater than a predetermined variation rate in a reference voltage used for generating the reference current, and outputs the power source abnormality detection signal, and
wherein the verify determination unit invalidates a result of the quality determination when the power source abnormality detection signal indicates an abnormal state of the power source voltage.
2. The semiconductor device according to claim 1 , further comprising:
an operational circuit using the memory module as a memory device; and
a control circuit that receives a command from the operational circuit and controls the memory module,
wherein the operational circuit instructs the control circuit to perform a verify operation again when the result of the quality determination is invalidated in the verify determination unit.
3. The semiconductor device according to claim 2 ,
wherein the operational circuit instructs the control circuit to perform a retry write operation when the result of the quality determination in the verify determination unit indicates a mismatch of the read data and the write data.
4. The semiconductor device according to claim 2 ,
wherein the verify determination unit has:
a data comparison unit that outputs a match result signal indicating a match result of the read data and write data relating to the memory cell; and
a verify result storage unit that stores the match result notified by the match result signal and a power source abnormality flag value notified by the power source abnormality detection signal,
and wherein the operational circuit refers to the match result and the power source abnormality flag value that are stored in the verify result storage unit.
5. The semiconductor device according to claim 1 , further comprising:
an operational circuit using the memory module as a memory device; and
a control circuit that receives a command from the operational circuit and controls the memory module,
wherein the operational circuit instructs the control circuit to perform a retry write operation when the result of the quality determination is invalidated in the verify determination unit.
6. The semiconductor device according to claim 1 , wherein the power source monitoring circuit monitors fluctuations of the power source voltage used for generating the cell current.
7. The semiconductor device according to claim 1 , wherein the predetermined variation rate is a variation rate of the power source voltage at which inversion occurs between a value of the cell current and a value of the reference current due to fluctuations of the power source voltage.
8. The semiconductor device according to claim 1 , wherein the power source monitoring circuit monitors fluctuations of the power source voltage in a period of reading read data from the memory cell.
9. The semiconductor device according to claim 1 , wherein the memory cell is a flash memory.
10. The semiconductor device according to claim 1 , wherein the verify determination unit invalidates a result of the quality determination regardless of the read data when the power source abnormality detection signal indicates an abnormal state of the power source voltage.
11. The semiconductor device according to claim 1 , wherein the power source monitoring circuit determines whether an abnormality of the power source voltage is present or not after read processing of the read data by the verify determination unit.
12. The semiconductor device according to claim 1 , wherein the power source monitoring circuit monitors fluctuations of the power source voltage in the vicinity of a sense amplifier that generates the cell current according to a storage state of the plurality of memory cells.