Method and apparatus for manufacturing semiconductor device
There is provided a method and an apparatus for manufacturing a semiconductor device having a lidless and highly reliable flip-chip structure. The method for manufacturing a semiconductor device wherein an underfill resin is filled in a space between a substrate and a semiconductor chip includes injecting a first underfill resin in said space under a first injecting condition; specifying a location where the fillet height of the underfill resin formed on the side of said semiconductor chip does not meet a prescribed standard; and injecting a second underfill resin in a location where the fillet height does not meet the prescribed standard under a second injecting condition. Since the fillet heights can uniformly meet the prescribed standard, the concentration of stress can be avoided, and a semiconductor device having a lidless and highly reliable flip-chip structure can be manufactured.
1 . A method for manufacturing a semiconductor device wherein an underfill resin is filled in a space between a substrate and a semiconductor chip, comprising:
injecting a first underfill resin in said space under a first injecting condition;
specifying a location where the fillet height of the underfill resin formed on the side of said semiconductor chip does not meet a prescribed standard; and
injecting a second underfill resin in a location where the fillet height does not meet the prescribed standard under a second injecting condition.
2 . The method for manufacturing a semiconductor device according to claim 1 , wherein said prescribed standard requires that said fillet height does not exceed the prescribed height set up to be lower than the height of the upper surface of said semiconductor chip.
3 . The method for manufacturing a semiconductor device according to claim 2 , wherein said prescribed height is at least 17% lower than the height of said semiconductor chip.
4 . The method for manufacturing a semiconductor device according to claim 2 , wherein said prescribed height is a height to cover at least an interlayer insulating film that composes a multilayer wiring structure formed on the circuit-forming plane of said semiconductor chip.
5 . The method for manufacturing a semiconductor device according to claim 4 , wherein the relative permittivity of said interlayer insulating film is lower than the relative permittivity of SiO2.
6 . The method for manufacturing a semiconductor device according to claim 1 , wherein injecting the underfill resin in said space under a first injecting condition is for injecting said underfill resin by moving a needle, which is a nozzle for ejecting said underfill resin, along a side of said semiconductor chip.
7 . The method for manufacturing a semiconductor device according to claim 1 , injecting the underfill resin in a location where the fillet height does not meet the prescribed standard under a second injecting condition is for injecting said underfill resin using an inkjet system.
8 . The method for manufacturing a semiconductor device according to claim 3 , wherein said semiconductor chip is flip-chip-mounted on sad substrate before said first injecting step; and
said semiconductor device has no lid on the upper surface of said semiconductor chip.
9 . The method for sequentially manufacturing a plurality of said semiconductor devices according to claim 1 , wherein injecting the underfill resin in said space under a first injecting condition is the same for any of the semiconductor devices.
10 . An apparatus for manufacturing a semiconductor device wherein an underfill resin is filled in a space between a substrate and a semiconductor chip, comprising:
a sensing unit for sensing the fillet height of the underfill resin formed on the side of said semiconductor chip;
a specifying unit for specifying a location where said fillet height does not meet a prescribed standard; and
an additional-injecting-condition selecting unit for selecting the injecting condition when said underfill resin is additionally injected to the specified location depending on the detected height of the fillet so that said fillet height meets said prescribed standard.