Assignment of Assignor's Interest

Recorded: 2008-12-04 Pages: 3

Assignor

KAWANO, SHOUTA

Executed: 2008-11-28

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Test board used for a reliability test and reliability test method

Application: 12/314,141 →

Publication: US 2009/0189632

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.