IP Library › Assignment 022253/0212
Patent Assignment
Reel/Frame 022253/0212

Assignment of Assignor's Interest

Recorded: 2009-01-29 Pages: 2
Assignors
OKAZAKI, SHINJI
Executed: 2008-12-24
HOTTA, SHOJI
Executed: 2009-01-13
SOHDA, YASUNARI
Executed: 2008-12-24
NAKAYAMA, YOSHINORI
Executed: 2008-12-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14 NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Its System
Patent: 7,943,903 →
Application: 12/320,574 →
Publication: US 2009/0206252
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →