Patent Assignment
Reel/Frame 022323/0018
Assignment of Assignor's Interest
Recorded: 2009-02-20
Pages: 3
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Integrated circuit design method for improved testability
Application:
12/379,411 →
Publication:
US 2009/0212818
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.