Patent Assignment
Reel/Frame 022417/0382
Assignment of Assignor's Interest
Recorded: 2009-03-18
Pages: 2
Assignor
KANASUGI, HIROSHI
Executed: 2009-02-02
Assignee
ADVANTEST CORPORATION
1-32-1, ASAHI-CHO, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property
(1)
Test Apparatus and Test Method for Testing a Plurality of Devices Under Test