IP Library › Assignment 022453/0555
Patent Assignment
Reel/Frame 022453/0555

Assignment of Assignor's Interest

Recorded: 2009-03-16 Pages: 3
Assignors
HIRASAKI, YASUYUKI
Executed: 2009-03-04
AOKI, YOSHITAKA
Executed: 2009-03-04
SHINBO, KATSUMI
Executed: 2009-03-04
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Integrated Circuit Including Built-in Self Test Circuit to Test Memory and Memory Test Method
Patent: 7,876,633 →
Application: 12/382,416 →
Publication: US 2009/0238018
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 28, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025214/0187 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →