Assignment of Assignor's Interest

Recorded: 2009-03-27 Pages: 3

Assignor

RENESAS TECHNOLOGY CORP.

Executed: 2007-07-11

Assignee

HITACHI, LTD.

6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN

Covered Property (1)

Quality Monitoring System for Building Structure, Quality Monitoring Method for Building Structure and Semiconductor Integrated Circuit Device

Patent: 6,950,767 →

Application: 10/706,972 →

Publication: US 2004/0153270

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.