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Patent Assignment
Reel/Frame 022476/0400

Assignment of Assignor's Interest

Recorded: 2009-03-31 Pages: 3
Assignors
ZHANG, ZHAO-LI
Executed: 2009-03-11
FANG, WEI
Executed: 2009-03-11
JAU, JACK
Executed: 2009-03-11
Assignee
HERMES MICROVISION, INC.
5F, NO. 18, CREATION ROAD 1, HSINCHU SCIENCE PARK, HSINCHU, R.O.C., TAIWAN
Covered Property (1)
Method and System for Determining a Defect During Charged Particle Beam Inspection of a Sample
Patent: 8,068,662 →
Application: 12/414,130 →
Publication: US 2010/0246929
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION, INC.
To: HERMES MICROVISION INCORPORATED B.V.
Reel/Frame 054866/0742 →
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION INCORPORATED B.V.
To: ASML NETHERLANDS B.V.
Reel/Frame 054870/0156 →