IP Library › Assignment 022522/0802
Patent Assignment
Reel/Frame 022522/0802

Assignment of Assignor's Interest

Recorded: 2009-04-07 Pages: 2
Assignors
YAMAGUCHI, KOHEI
Executed: 2009-02-18
OBARA, KENJI
Executed: 2009-01-30
HIRAI, TAKEHIRO
Executed: 2009-01-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Tool and Method of Parameter Tuning for Defect Inspection Tool
Patent: 8,139,847 →
Application: 12/370,784 →
Publication: US 2009/0222753
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →