Patent Assignment
Reel/Frame 022613/0823
Assignment of Assignor's Interest
Recorded: 2009-04-27
Pages: 3
Assignors
TAKAHASHI, HARUO
Executed: 2009-04-15
IKKU, YUTAKA
Executed: 2009-04-15
YAMAMOTO, YO
Executed: 2009-04-15
IWASAKI, KOUJI
Executed: 2009-04-15
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Composite Charged Particle Beam Apparatus, Method of Processing a Sample and Method of Preparing a Sample for a Transmission Electron Microscope Using the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.