Patent Assignment
Reel/Frame 022613/0913
Assignment of Assignor's Interest
Recorded: 2009-04-27
Pages: 3
Assignor
YASUTAKE, MASATOSHI
Executed: 2009-04-09
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Conductivity Measuring Apparatus and Conductivity Measuring Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.