Patent Assignment
Reel/Frame 022623/0935
Assignment of Assignor's Interest
Recorded: 2009-04-30
Pages: 4
Assignors
XIAO, HONG
Executed: 2009-04-27
FANG, WEI
Executed: 2009-04-28
JAU, JACK
Executed: 2009-04-29
Assignee
HERMES MICROVISION, INC.
5F, NO. 18, CREATION ROAD 1, SCIENCE PARK, HSIN-CHU, 300, TAIWAN
Covered Property
(1)
Method for Inspecting Overlay Shift Defect During Semiconductor Manufacturing and Apparatus Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.