IP Library Assignment 022656/0911
Patent Assignment
Reel/Frame 022656/0911

Assignment of Assignor's Interest

Recorded: 2009-05-08 Pages: 2
Assignors
TOYODA, YASUTAKA
Executed: 2007-07-09
SUTANI, TAKUMICHI
Executed: 2007-07-11
MATSUOKA, RYOICHI
Executed: 2007-07-11
NAYA, HIDEMITSU
Executed: 2007-07-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Inspection Apparatus and Semiconductor Inspection System
Patent: 7,978,904 →
Application: 11/834,218 →
Publication: US 2008/0175469
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →