IP Library Assignment 022663/0541
Patent Assignment
Reel/Frame 022663/0541

Assignment of Assignor's Interest

Recorded: 2009-05-11 Pages: 2
Assignors
SHIBATA, YUKIHIRO
Executed: 2009-03-10
YOSHITAKE, YASUHIRO
Executed: 2009-03-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Apparatus and Method
Patent: 8,416,292 →
Application: 12/389,962 →
Publication: US 2009/0213215
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →