IP Library › Assignment 022664/0899
Patent Assignment
Reel/Frame 022664/0899

Assignment of Assignor's Interest

Recorded: 2009-05-11 Pages: 2
Assignors
KANEOKA, NORIYUKI
Executed: 2007-07-23
UMEMURA, KAORU
Executed: 2007-07-23
ISHIGURO, KOJI
Executed: 2007-07-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam System, Sample Processing Method, and Semiconductor Inspection System
Patent: 7,777,183 →
Application: 11/834,220 →
Publication: US 2008/0029699
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →