IP Library Assignment 022706/0218
Patent Assignment
Reel/Frame 022706/0218

Assignment of Assignor's Interest

Recorded: 2009-05-19 Pages: 3
Assignors
WAKIYAMA, SHIGERU
Executed: 2009-04-20
AKAMATSU, KENICHI
Executed: 2009-04-20
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Apparatus Structure and Scanning Probe Microscope Including Apparatus Structure
Patent: 7,945,964 →
Application: 12/415,237 →
Publication: US 2009/0255016
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →